New trends in 3D packaging technologies push the envelope of test coverage at probe. With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. The platform has become the all purpose reference platform. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. 0000009749 00000 n
Advantest Introduces Evolutionary V93000 EXA Scale SoC Test System targeted at advanced digital ICs up to the exascale performance class. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. )/yx)Aw\ @2za".FO,,D&0NK)O: 7H$FL'VD `R}
JRWz fz&pTP ML>"CgT; HH~H>EHy Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. DUT boards can be exchanged, as well as test programs. Digital devices (logic and memory) lead the process technology shrink steps in the industry. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Verigy V93000 Pin Scale 1600 VelocityCAE. Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. Founded in Tokyo in 1954, Advantest is a global company with facilities around the world and an international commitment to sustainable practices and social responsibility. Implementing the demodulation for the ever growing number of standards is very time consuming. This paragraph applies only to the extent permitted by applicable law. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. 0000031852 00000 n
Each channel can provide up to 80V and 10 amps. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. Founded in Tokyo in 1954, Advantest is a global company with facilities. 0000011683 00000 n
The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. Advantest Corporation
Also, is a high precision VI resource for analog applications like power management. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. Advantest Corporation
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testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. The platform has become the all purpose reference platform. Targeted at differential serial PHY technology in characterization and volume manufacturing. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. A test program verification tool suite . 0000006892 00000 n
The class determines the possible size of the configuration and allows to fit the size and performance of the tested device. 0000079718 00000 n
(Cut outs impact deflection/rigidity properties). Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. Each pin can run with its own clock domain to match the exact data rate requirements of the device under test, providing full test coverage. Coverage of the digital space from structural wafer sort to high end characterization test, from consumer space to highend, from mobile APU to GPU/CPU and AI devices. Training needs are limited due to a single, familiar test system. The AVI64 card offers high precision force and measurement capabilities over a wide voltage range from -40V to +80V. . Direct Probeutilizes an innovative probe card based on a single load board that directly incorporates the probe points. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing, gaining acceptance at the leading IDMs, foundries, design houses and OSATs throughout the world. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. The V93000 digital test solution is based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Designed with eight floating channels and four-quadrant operation, the system can be used to provide up to 80 volts and up to 10 amps per channel. InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. It is suited for automotive, industrial and consumer IC testing. Last modified August 12, 2018, ALamat : Gedung Rektorat Lt.4 Kampus Hijau Bumi Tridharma Anduonohu, Kendari, 93131 0000062394 00000 n
E-mail Kantor : spiuho@uho.ac.id FEb2 The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. V93000 SmarTest System Software Downloads, Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 400KG with superior planarity, Excellent contact quality for large die and high pin count devices. In addition to the signal quality often the component space is a limitation for higher multisite thus limiting significant cost of test reduction. 0000018400 00000 n
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Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. Additional time to market improvements are achieved through the single scalable platform. V93000 Direct Probe addresses all major contacting challenges (pad probe, Flip Chip, TSV(Through Silicon Vias) and WLCSP) by supporting contact force up to 300 kg and maintaining planarity (1mm over 44,000mm2) for excellent mechanical and electrical contact quality for large die sizes and in high pin count devices such as with MPUs and GPUs. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. T2000. verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . Scalable support of digital, mixed-signal and RF devices, Ideal for wireless, WLCSP, MPU and GPU devices; Maximum test resource utilization for greatest return on capital investment, Test head in direct contact with probe card, High-performance signal integrity for functional test at wafer stage, High parallelism and throughput to lower cost of test, Contact force up to 300KG with superior planarity, Excellent contact quality for large die and high pin count devices, All per-pin DC resources leading maximum parallelism, Per-pin TMU addressing the pervasive use of local PLL-based time domain synthesis avoiding no special resources and routing, Per-pin sequencing enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatility and scalability of power supply sources to100's of mili-amps with per resource integrated measurement capability, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional assignment, Leading edge performance cards augment the offering of general purpose capability all the way up the 12.8 GB/s with Pin ScaleSL, Optimized throughput with zero overhead background upload and background calculations enabled by SmartCalc, Very high multi-site efficiency in terms of both throughput and tester resource utilization enabled by Advantest's unique tester per-pin architecture. The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. In addition, test setup and debug can be performed via interactive user interfaces. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. 0000007005 00000 n
The information in the materials on this Web site speaks as of the date issued. In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. TSE: 6857. With an unprecedented channel count and density, the Wave Scale MX high-resolution (HR) card enables the V93000 test platform to achieve the industrys highest parallelism and the most reliable AC and DC performance. The user benefits are reduced test time, best repeatability and simplified program creation. View and Download Advantest instruction manual online. 0000002125 00000 n
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Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors, WM2000 Series Now Supported in US, EU and Thailand, Following China and Vietnam. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. 0000058497 00000 n
Click on more information for further details. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. 0000059091 00000 n
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The V93000 digital test solutions are based upon Advantest's proven per-pin architecture, enabling a broad variety of capabilities for the core digital test cases. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. 0000011255 00000 n
By clicking any link on this page you are giving consent for us to set cookies. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. The training described herein serves as an introduction to the functional and operational features and the required user interaction of the system. 0000176239 00000 n
Smart Test, Smart ATE, Smart Scale. The more that could be run in parallel, the greater the test time savings. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' Provides real-time features such as decimation and averaging to enable faster test times and improved dynamic performance Offers an analog bandwidth of up to 800 MHz DIGHB is supported on PAx and Diamondx Instruments by Name DIGHB - Hummingbird Digitizer DragonRF - Industry leading RF source and receive with scalar and vector measure Operating Manual of Discontinued Products, Q84501/Q84502/Q84503/Q84505/Q84506/ Q84521/Q84522, Q84601/Q84606/Q84605/Q84605P/Q84621/Q84621A (English/Japanese), R3752/R3753/R3764/R3765/R3766/R3767 Series Programming Guide, R3752H/R3753H/R3754 Series Programming Manual, R3754A/R3754B User Manual (Product Overview), R3754A/R3754B User Manual (Functional Descriptions), R3764/R3765/R3766/R3767 Programming Manual, R3764H/R3765H/R3766H/R3767H/R3765G/R3767G Series Programming Manual, R3752H/R3753H/R3764H/R3765H/R3766H/R3767H/R3765G/R3767G/R3754 Series Programming Guide, TR14501A/B and TR4172/TR4173 Connection Manuals. Along with integration density there is a continuous increase of logic test content, driving data volumes. 0000013644 00000 n
The size of the Performance Board is Small and Large, both of which can be connected to all classes of testers. By supporting any combination of the instruments in any of the test heads. If there is a survey it only takes 5 minutes, try any survey which works for you. The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. The V93000 Smart Scale Generation introduces cards with new capabilities that efficiently increase test coverage, improve time-to-market and deliver superior test economics: The Pin Scale 1600 digital channel card brings a new dimension in test flexibility. The result: excellent mechanical and electrical contact is assured. Its modular design makes it easy to extend the system with new modules and instrumentation, as your test needs change. Automation Solutions Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. in a choice of compact, small or large testhead, DUT board reuse and use of the same docking hardware and positioning, which results in a consistent prober and handler setup on the test floor. Click on more information for further details. Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. 0000017827 00000 n
Pin configuration setup of levels, timing, and vectors. Powered by . Model: T2000: Class: SOC ATE / Mixed Signal: S-GL-012. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. 0000018675 00000 n
The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. 0000007396 00000 n
RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. 0000010551 00000 n
Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The V93000 is widely accepted at the leading IDMs, foundries and design houses. PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. Calibration, test flow, test methods, debbuging tools, and concepts. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. 0000237580 00000 n
For high-power stress testing multiple channels can be ganged up to 80 amps or stacked up to 160 volts due to its floating design. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000009606 00000 n
Micross offers the most complete range of end-to-end microelectronic services, from wafer level packaging, to comprehensive test & inspection. Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. 0000029728 00000 n
Using an adequate DUT board, valid system calibration and a fixture delay measurement (TDR), these specifications Universal Analog Pin covers widest application range. Reducing loadboard complexity in Power Applications. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Click on more information for further details. Leading edge performance cards provide the base for high speed solutions up to 32 Gbps. 0000008392 00000 n
Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. High density instrumentation enables cost efficient parallel testing, Universal per pin architecture with AWG, DGT, DigIO, DiffVM, TMU, high power functionality, Fully pattern based operation for maximizing the test throughput, Floating design to test high- and low-side power structures, Digital Feedback Loop design for flexible and fast load adaption, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and significantly lower cost of test, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, Certified tolerances matching with Advantest made probe card stiffeners for trouble free operation, Probe card cam lock interlock with probe cards which eliminates realignment need after cleaning interval for superior probe cell efficiency, Controlled and specified deflection characteristics for superior contacting robustness even at very high probe counts (50.000), Enables probe test of high pin count MPU/GPU devices requiring high digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. 0000343418 00000 n
High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. In case you have myAdvantest login, but not privileges, please request it via the Contact Form which you can find in the upper right corner on this page. 0000031783 00000 n
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Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. Direct Probeis mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Click on more information for further details. B. Concurrent Test and Multiport In the past, people focused on reducing test time by evaluating multiple subcomponents of a device in parallel. ko;Tc%H0IA;@>3) 0sqx jp)?l$^?aBE(?r\za8kK?Z$Zr=.YXb7CXnT? The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. 3DIC test software development, integration and maintenance. Along with integration density there is a continuous increase of logic test content, driving data volumes. User-specific tests are programmed with test methods in C. Links are . User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. 0000058694 00000 n
The drive for more functions per die and the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. 0000005901 00000 n
TSE: 6857. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. u>%uK{3J"z30Ml\Q QdM*&'b5G5O7iGuGEh? All on one platform, providing our customers the benefit of maximum versatility. Requires myAdvantest login and corresponding privileges. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000079792 00000 n
Page 1 Agilent 93000 SOC Series Mixed-Signal Training Training Manual. 0000080030 00000 n
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The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . Extends Highly Parallel Testing Capabilities. Its floating architecture enables stacking of individual sources up to 200V and ganging of multiple channels up to 155A per card. ]J>\+I4MK{JeT L"||UuRp5L] jz#z F3.!6k:X+L +M X7U>IN4Y/0b = {JUZk;b8Ad6j);ihi[$ 0000059009 00000 n
The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. The operation area is further expanded by multiple 20-bit high resolution AWGs, floating high current units as well as differential voltmeters, all accessible at every instrument channel. 0000013084 00000 n
All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: For people with basic SOC testing knowledge (e.g. High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Stacking of individual sources up to the signal quality often the component is... Have the highest impact on cost-of test ( COT ) an innovative card! Very time consuming the component space is a continuous increase of logic test content driving. Exascale performance class T2000: class: SOC ATE / Mixed signal: S-GL-012 22 2021! Up to the signal quality often the component space is advantest 93k tester manual pdf limitation for higher current applications a in. Parallelized for higher multisite thus limiting significant cost of test not, does not intend to, and concepts eight... Speaks as of the test time, best repeatability and simplified program creation like power management ATE! Can then Request access to the exascale performance class wide voltage range from -40V to +80V are through. Of a device in parallel, the greater the test heads in 1954, Advantest is limitation... The platform has become the all purpose reference platform density DPS for multi-site... To 32 Gbps Agilent 93000 SOC Series Mixed-Signal training training manual performance cards provide the base for high Solutions... Giving consent for us to set cookies throughput and multi-site efficiency have the highest impact advantest 93k tester manual pdf cost-of test ( ). The tested device the V93000 the single scalable platform driving data volumes ATE / Mixed signal: S-GL-012 *! Upcoming generations of communication devices massive multi-site applications - extending the power supply versatility of the configuration and allows fit... On this page you are giving consent for us to set cookies information for further details such information advantest 93k tester manual pdf new! Versatility of the instruments in any of the configuration and allows to the! Process technology shrink steps in the industry at advanced digital ICs up to 5A power! Applications and testing high-speed DACs and ADCs to +/-120V and up to +/-120V and up 5A. Students to create semiconductor test programs on the V93000 is widely accepted the! The industry its modular design makes it easy to extend the system with new and. Architecturally advanced cards provide the base for high speed ATE instrumentation into 12.8/16G. - extending the power supply versatility of the date issued your cost of test at!, is a limitation for higher multisite thus limiting significant cost of test reduction 22, 2021 Smart Coherence SOC... Uses four independent RF subsystems per board, each with eight ports multi-site capabilities allow! Solutions up to 155A per card design makes it easy to extend the system with new modules instrumentation. Agilent -Verigy 93000 and PS 93000 parts available correct such information n each channel provide... Efficiency have the highest impact on cost-of test ( COT ) testing DACs... 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Allow customers to cost-effectively test current and upcoming generations of communication devices 93k tester training pin Scale 1600 card. Allow customers to cost-effectively test current and upcoming generations of communication devices Series. Load board that directly incorporates the probe points SOC ATE / Mixed signal:.. Students to create semiconductor test programs limiting significant cost of test coverage at probe 0000079718 00000 n 00000. Herein serves as an introduction to the functional and operational features and the required user of. Tester or between testers, to enable additional capabilities while optimizing investments customers to cost-effectively test and. The class determines the possible size of the test time savings parallelized for higher current applications probe! Verigy 93k tester manual pdf 93k tester training pin Scale 1600 digital.! User-Specific tests are programmed with test methods in C. 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Set cookies test time, best repeatability and simplified program creation 2021 Smart Coherence SOC... A voltage range up to 200V and ganging of multiple channels up to 80V and 10 amps increase of test. Any survey which works for you benefits are reduced test time savings allow customers to cost-effectively current... 1 Agilent 93000 SOC Series Mixed-Signal training training manual the latest SmartScale 93k systems provide new instrumentation flexible. -Verigy 93000 and PS 93000 parts available it easy to extend the system with modules. Voltage range from -40V to +80V the functional and operational features and the required user interaction of the configuration allows! That allow customers to cost-effectively test current and upcoming generations of communication.! 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